Persistent Link:
http://hdl.handle.net/10150/605427
Title:
MULTISTATE ANALOG AND DIGITAL INTEGRATED CIRCUITS
Author:
Abraham, George
Affiliation:
US Naval Research Laboratory
Issue Date:
1973-10
Rights:
Copyright © International Foundation for Telemetering
Collection Information:
Proceedings from the International Telemetering Conference are made available by the International Foundation for Telemetering and the University of Arizona Libraries. Visit http://www.telemetry.org/index.php/contact-us if you have questions about items in this collection.
Publisher:
International Foundation for Telemetering
Journal:
International Telemetering Conference Proceedings
Abstract:
Several independent physical phenomena in unipolar and bipolar semiconductor pn junction devices and integrated structures lead to voltage and current-controlled negative resistance without the use of external feedback. These include avalanche breakdown, quantum mechanical tunneling, and minority carrier storage. Two complementary types of negative resistances may be utilized as a basis for generating multistable energy levels. The number of stable states and their relative spacings can be readily varied. Without negative resistance interaction, M+1 stable states can be generated where M is the number of negative resistance devices involved. With negative resistance interactions, additional multistability occurs, resulting in a total number of (M+1) + (M-1)!stable states. S-S, N-N, and S-N interactions are analyzed. In the latter case, complementary negative resistances can be made to annihilate each other. Multistate tunnel and avalanche negative resistances have been made to occur in single devices resulting in tristable, quadristable and higher order energy levels. Variable radix counters, oscillators, frequency dividers, and high density memory elements have been fabricated both as hybrid and monolithic integrated circuits.
Sponsors:
International Foundation for Telemetering
ISSN:
0884-5123; 0074-9079
Additional Links:
http://www.telemetry.org/

Full metadata record

DC FieldValue Language
dc.language.isoen_USen
dc.titleMULTISTATE ANALOG AND DIGITAL INTEGRATED CIRCUITSen_US
dc.contributor.authorAbraham, Georgeen
dc.contributor.departmentUS Naval Research Laboratoryen
dc.date.issued1973-10en
dc.rightsCopyright © International Foundation for Telemeteringen
dc.description.collectioninformationProceedings from the International Telemetering Conference are made available by the International Foundation for Telemetering and the University of Arizona Libraries. Visit http://www.telemetry.org/index.php/contact-us if you have questions about items in this collection.en
dc.publisherInternational Foundation for Telemeteringen
dc.description.abstractSeveral independent physical phenomena in unipolar and bipolar semiconductor pn junction devices and integrated structures lead to voltage and current-controlled negative resistance without the use of external feedback. These include avalanche breakdown, quantum mechanical tunneling, and minority carrier storage. Two complementary types of negative resistances may be utilized as a basis for generating multistable energy levels. The number of stable states and their relative spacings can be readily varied. Without negative resistance interaction, M+1 stable states can be generated where M is the number of negative resistance devices involved. With negative resistance interactions, additional multistability occurs, resulting in a total number of (M+1) + (M-1)!stable states. S-S, N-N, and S-N interactions are analyzed. In the latter case, complementary negative resistances can be made to annihilate each other. Multistate tunnel and avalanche negative resistances have been made to occur in single devices resulting in tristable, quadristable and higher order energy levels. Variable radix counters, oscillators, frequency dividers, and high density memory elements have been fabricated both as hybrid and monolithic integrated circuits.en
dc.description.sponsorshipInternational Foundation for Telemeteringen
dc.identifier.issn0884-5123en
dc.identifier.issn0074-9079en
dc.identifier.urihttp://hdl.handle.net/10150/605427en
dc.identifier.journalInternational Telemetering Conference Proceedingsen
dc.typetexten
dc.typeProceedingsen
dc.relation.urlhttp://www.telemetry.org/en
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