Persistent Link:
http://hdl.handle.net/10150/291358
Title:
Phase-conjugate interferometry for thin film analysis
Author:
Parshall, Elaine Ruth, 1962-
Issue Date:
1990
Publisher:
The University of Arizona.
Rights:
Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
Abstract:
A phase-conjugate interferometric method of thin film analysis obtains three independent parameters with which to determine a film's refractive index n, absorption coefficient kappa, and thickness d. Because dimensionless intensity ratios are used, this method is self-calibrating except for light source polarization and incident angle. The use of self-pumped phase-conjugate reflectors makes the interferometer self-aligning and results in infinite spacing of fringes of equal thickness. A single layer thin film sample was analyzed by this technique, and the results compared to those of ellipsometry.
Type:
text; Thesis-Reproduction (electronic)
Keywords:
Physics, Optics.
Degree Name:
M.S.
Degree Level:
masters
Degree Program:
Graduate College; Optical Sciences
Degree Grantor:
University of Arizona
Advisor:
Gaskill, J. D.

Full metadata record

DC FieldValue Language
dc.language.isoen_USen_US
dc.titlePhase-conjugate interferometry for thin film analysisen_US
dc.creatorParshall, Elaine Ruth, 1962-en_US
dc.contributor.authorParshall, Elaine Ruth, 1962-en_US
dc.date.issued1990en_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.description.abstractA phase-conjugate interferometric method of thin film analysis obtains three independent parameters with which to determine a film's refractive index n, absorption coefficient kappa, and thickness d. Because dimensionless intensity ratios are used, this method is self-calibrating except for light source polarization and incident angle. The use of self-pumped phase-conjugate reflectors makes the interferometer self-aligning and results in infinite spacing of fringes of equal thickness. A single layer thin film sample was analyzed by this technique, and the results compared to those of ellipsometry.en_US
dc.typetexten_US
dc.typeThesis-Reproduction (electronic)en_US
dc.subjectPhysics, Optics.en_US
thesis.degree.nameM.S.en_US
thesis.degree.levelmastersen_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.disciplineOptical Sciencesen_US
thesis.degree.grantorUniversity of Arizonaen_US
dc.contributor.advisorGaskill, J. D.en_US
dc.identifier.proquest1341472en_US
dc.identifier.bibrecord.b26362934en_US
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