ANALYTICAL APPLICATIONS OF PARTICLE INDUCED X-RAY EMISSION (PIXE) SPECTROSCOPY

Persistent Link:
http://hdl.handle.net/10150/282084
Title:
ANALYTICAL APPLICATIONS OF PARTICLE INDUCED X-RAY EMISSION (PIXE) SPECTROSCOPY
Author:
Kirchner, Stephen John
Issue Date:
1981
Publisher:
The University of Arizona.
Rights:
Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
Abstract:
Quantitative multielemental analysis using Particle Induced X-ray Emission (PIXE) using 1 and 2 MeV proton bombardment on thin targets has been achieved. The method is based on the calculation of atomic ratios from experimentally determined relative x-ray efficiency curves. Sample preparation techniques involving digestion and homogenous deposition of samples and standards with a minimum of contamination have been investigated. The accuracy of the method has been evaluated using five standard reference materials obtained from the National Bureau of Standards. The elimination of bremsstrahlung associated with the charging effect of non-conducting samples in PIXE analysis has been accomplished using thin carbon foils in the beam path. Applications of the PIXE technique to studies on deep-sea ferromanganese nodules were performed. The utility of PIXE in the analysis of noduoles and in the following of the distribution of a large number of elements through the various stages of a processing scheme were demonstrated.
Type:
text; Dissertation-Reproduction (electronic)
Keywords:
Manganese nodules -- Spectra.; X-ray spectroscopy.
Degree Name:
Ph.D.
Degree Level:
doctoral
Degree Program:
Graduate College; Chemistry
Degree Grantor:
University of Arizona
Advisor:
Fernando, Quintus

Full metadata record

DC FieldValue Language
dc.language.isoen_USen_US
dc.titleANALYTICAL APPLICATIONS OF PARTICLE INDUCED X-RAY EMISSION (PIXE) SPECTROSCOPYen_US
dc.creatorKirchner, Stephen Johnen_US
dc.contributor.authorKirchner, Stephen Johnen_US
dc.date.issued1981en_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.description.abstractQuantitative multielemental analysis using Particle Induced X-ray Emission (PIXE) using 1 and 2 MeV proton bombardment on thin targets has been achieved. The method is based on the calculation of atomic ratios from experimentally determined relative x-ray efficiency curves. Sample preparation techniques involving digestion and homogenous deposition of samples and standards with a minimum of contamination have been investigated. The accuracy of the method has been evaluated using five standard reference materials obtained from the National Bureau of Standards. The elimination of bremsstrahlung associated with the charging effect of non-conducting samples in PIXE analysis has been accomplished using thin carbon foils in the beam path. Applications of the PIXE technique to studies on deep-sea ferromanganese nodules were performed. The utility of PIXE in the analysis of noduoles and in the following of the distribution of a large number of elements through the various stages of a processing scheme were demonstrated.en_US
dc.typetexten_US
dc.typeDissertation-Reproduction (electronic)en_US
dc.subjectManganese nodules -- Spectra.en_US
dc.subjectX-ray spectroscopy.en_US
thesis.degree.namePh.D.en_US
thesis.degree.leveldoctoralen_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.disciplineChemistryen_US
thesis.degree.grantorUniversity of Arizonaen_US
dc.contributor.advisorFernando, Quintusen_US
dc.identifier.proquest8209920en_US
dc.identifier.oclc8733451en_US
dc.identifier.bibrecord.b13926925en_US
All Items in UA Campus Repository are protected by copyright, with all rights reserved, unless otherwise indicated.