Enhancement and evaluation of SCIRTSS (sequential circuits test search system) on ISCAS'89 benchmark sequential circuits

Persistent Link:
http://hdl.handle.net/10150/278283
Title:
Enhancement and evaluation of SCIRTSS (sequential circuits test search system) on ISCAS'89 benchmark sequential circuits
Author:
Liando, Johnny, 1964-
Issue Date:
1990
Publisher:
The University of Arizona.
Rights:
Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
Abstract:
SCIRTSS, the automatic test pattern generation system for sequential circuit described in AHPL, has been improved to have the best and correct version of the D-Algorithm. This improvement works together with the recent enhancement of the backward state justification search. SCIRTSS now has a complete set of procedures to generate tests for sequential circuits. The performance of SCIRTSS is evaluated using the recent ISCAS'89 sequential benchmark circuits. The overall concepts of how SCIRTSS generate tests, the improvements made on the D-Algorithm, and the benchmark results are presented in this thesis.
Type:
text; Thesis-Reproduction (electronic)
Keywords:
Engineering, Electronics and Electrical.; Computer Science.
Degree Name:
M.S.
Degree Level:
masters
Degree Program:
Graduate College
Degree Grantor:
University of Arizona
Advisor:
Hill, Fredrick J.

Full metadata record

DC FieldValue Language
dc.language.isoen_USen_US
dc.titleEnhancement and evaluation of SCIRTSS (sequential circuits test search system) on ISCAS'89 benchmark sequential circuitsen_US
dc.creatorLiando, Johnny, 1964-en_US
dc.contributor.authorLiando, Johnny, 1964-en_US
dc.date.issued1990en_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.description.abstractSCIRTSS, the automatic test pattern generation system for sequential circuit described in AHPL, has been improved to have the best and correct version of the D-Algorithm. This improvement works together with the recent enhancement of the backward state justification search. SCIRTSS now has a complete set of procedures to generate tests for sequential circuits. The performance of SCIRTSS is evaluated using the recent ISCAS'89 sequential benchmark circuits. The overall concepts of how SCIRTSS generate tests, the improvements made on the D-Algorithm, and the benchmark results are presented in this thesis.en_US
dc.typetexten_US
dc.typeThesis-Reproduction (electronic)en_US
dc.subjectEngineering, Electronics and Electrical.en_US
dc.subjectComputer Science.en_US
thesis.degree.nameM.S.en_US
thesis.degree.levelmastersen_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.grantorUniversity of Arizonaen_US
dc.contributor.advisorHill, Fredrick J.en_US
dc.identifier.proquest1342474en_US
dc.identifier.bibrecord.b26541166en_US
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