Persistent Link:
http://hdl.handle.net/10150/278177
Title:
The polarized light scattering matrix elements for rough surface
Author:
Hsu, Jiunn-Yann, 1959-
Issue Date:
1992
Publisher:
The University of Arizona.
Rights:
Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
Abstract:
The light scattered from a scatterer depends on the geometrical properties such as size, shape, and their distributions as well as electromagnetic properties such as the complex index of reflection. The four major Mueller scattering matrix elements have been experimentally measured for an aluminum rough surface scattering laser light at lambda = 441.6nm for various incident angles. Measurements were also made for non-conducting diffuse surface and an aluminum coated diffuse surface. The sixteen Mueller matrix elements of these diffuse surfaces were measured in order to study the relative role of reflectance and roughness for scattering from a rough surface. Some representative matrix elements for the rough surfaces as well as for conducting and non-conducting rough surfaces are shown. S11 and S34 are sensitive to illumination angles and surface variation. S33 are sensitive to illumination angles only. S34 are very sensitive to the change of refractive index from real to complex.
Type:
text; Thesis-Reproduction (electronic)
Keywords:
Physics, Optics.
Degree Name:
M.S.
Degree Level:
masters
Degree Program:
Graduate College
Degree Grantor:
University of Arizona
Advisor:
Bickel, William S.

Full metadata record

DC FieldValue Language
dc.language.isoen_USen_US
dc.titleThe polarized light scattering matrix elements for rough surfaceen_US
dc.creatorHsu, Jiunn-Yann, 1959-en_US
dc.contributor.authorHsu, Jiunn-Yann, 1959-en_US
dc.date.issued1992en_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.description.abstractThe light scattered from a scatterer depends on the geometrical properties such as size, shape, and their distributions as well as electromagnetic properties such as the complex index of reflection. The four major Mueller scattering matrix elements have been experimentally measured for an aluminum rough surface scattering laser light at lambda = 441.6nm for various incident angles. Measurements were also made for non-conducting diffuse surface and an aluminum coated diffuse surface. The sixteen Mueller matrix elements of these diffuse surfaces were measured in order to study the relative role of reflectance and roughness for scattering from a rough surface. Some representative matrix elements for the rough surfaces as well as for conducting and non-conducting rough surfaces are shown. S11 and S34 are sensitive to illumination angles and surface variation. S33 are sensitive to illumination angles only. S34 are very sensitive to the change of refractive index from real to complex.en_US
dc.typetexten_US
dc.typeThesis-Reproduction (electronic)en_US
dc.subjectPhysics, Optics.en_US
thesis.degree.nameM.S.en_US
thesis.degree.levelmastersen_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.grantorUniversity of Arizonaen_US
dc.contributor.advisorBickel, William S.en_US
dc.identifier.proquest1349459en_US
dc.identifier.bibrecord.b27692516en_US
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