Electromagnetic characterization of shielded multiconductor microstrip-line discontinuities using the time-domain finite-difference method

Persistent Link:
http://hdl.handle.net/10150/278050
Title:
Electromagnetic characterization of shielded multiconductor microstrip-line discontinuities using the time-domain finite-difference method
Author:
Chan, Michael, 1963-
Issue Date:
1990
Publisher:
The University of Arizona.
Rights:
Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
Abstract:
The time-domain finite difference (TD-FD) method is applied to obtain the frequency-dependent characteristics of shielded multiconductor microstrip line interconnect structures. A Gaussian pulse is used as the excitation source and the reflected, transmitted, and coupled pulses on the various lines are used for the calculation of the frequency-dependent elements in the scattering matrix representation of the structure. In order to correctly specify the frequency range of applicability of the results, the cutoff frequencies of the higher-order modes of the structures under consideration need to be found. This is done by a two-dimensional application of the TD-FD method over the cross-section of the multiconductor transmission line, based on the simple observation that modes at cutoff are characterized by the fact that ∂/∂z = 0 where z is the direction of propagation along the axis of the line. Numerical results are obtained for the dispersive characteristics of coupled microstrip lines and the frequency-dependent scattering parameters of a microstrip open-end line, a 90° bend, a right-angle via, and the discontinuity which occurs when one of the two lines is terminated in a coupled symmetric microstrip geometry.
Type:
text; Thesis-Reproduction (electronic)
Keywords:
Engineering, Electronics and Electrical.
Degree Name:
M.S.
Degree Level:
masters
Degree Program:
Graduate College
Degree Grantor:
University of Arizona
Advisor:
Cangellaris, Andreas C.

Full metadata record

DC FieldValue Language
dc.language.isoen_USen_US
dc.titleElectromagnetic characterization of shielded multiconductor microstrip-line discontinuities using the time-domain finite-difference methoden_US
dc.creatorChan, Michael, 1963-en_US
dc.contributor.authorChan, Michael, 1963-en_US
dc.date.issued1990en_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.description.abstractThe time-domain finite difference (TD-FD) method is applied to obtain the frequency-dependent characteristics of shielded multiconductor microstrip line interconnect structures. A Gaussian pulse is used as the excitation source and the reflected, transmitted, and coupled pulses on the various lines are used for the calculation of the frequency-dependent elements in the scattering matrix representation of the structure. In order to correctly specify the frequency range of applicability of the results, the cutoff frequencies of the higher-order modes of the structures under consideration need to be found. This is done by a two-dimensional application of the TD-FD method over the cross-section of the multiconductor transmission line, based on the simple observation that modes at cutoff are characterized by the fact that ∂/∂z = 0 where z is the direction of propagation along the axis of the line. Numerical results are obtained for the dispersive characteristics of coupled microstrip lines and the frequency-dependent scattering parameters of a microstrip open-end line, a 90° bend, a right-angle via, and the discontinuity which occurs when one of the two lines is terminated in a coupled symmetric microstrip geometry.en_US
dc.typetexten_US
dc.typeThesis-Reproduction (electronic)en_US
dc.subjectEngineering, Electronics and Electrical.en_US
thesis.degree.nameM.S.en_US
thesis.degree.levelmastersen_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.grantorUniversity of Arizonaen_US
dc.contributor.advisorCangellaris, Andreas C.en_US
dc.identifier.proquest1341828en_US
dc.identifier.bibrecord.b26429676en_US
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