Defect detection in periodic VLSI circuits using digital image processing

Persistent Link:
http://hdl.handle.net/10150/277265
Title:
Defect detection in periodic VLSI circuits using digital image processing
Author:
Malhis, Luai Mohammed, 1964-
Issue Date:
1990
Publisher:
The University of Arizona.
Rights:
Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
Abstract:
A defect detection algorithm applicable for periodic VLSI circuitry is presented in this thesis. Even though the algorithm is based on the reference comparison approach, the periodicity of the circuit eliminates the need for the so called "golden wafer." The suggested algorithm has demonstrated the ability to detect defects of small area (0.023% of the image area). In addition, the algorithm was 93% successful in defect detection and has a false alarm rate of 0.067 per inspected frame, based on testing 20 frames.
Type:
text; Thesis-Reproduction (electronic)
Keywords:
Engineering, Electronics and Electrical.
Degree Name:
M.S.
Degree Level:
masters
Degree Program:
Graduate College
Degree Grantor:
University of Arizona
Advisor:
Strickland, Robin N.

Full metadata record

DC FieldValue Language
dc.language.isoen_USen_US
dc.titleDefect detection in periodic VLSI circuits using digital image processingen_US
dc.creatorMalhis, Luai Mohammed, 1964-en_US
dc.contributor.authorMalhis, Luai Mohammed, 1964-en_US
dc.date.issued1990en_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.description.abstractA defect detection algorithm applicable for periodic VLSI circuitry is presented in this thesis. Even though the algorithm is based on the reference comparison approach, the periodicity of the circuit eliminates the need for the so called "golden wafer." The suggested algorithm has demonstrated the ability to detect defects of small area (0.023% of the image area). In addition, the algorithm was 93% successful in defect detection and has a false alarm rate of 0.067 per inspected frame, based on testing 20 frames.en_US
dc.typetexten_US
dc.typeThesis-Reproduction (electronic)en_US
dc.subjectEngineering, Electronics and Electrical.en_US
thesis.degree.nameM.S.en_US
thesis.degree.levelmastersen_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.grantorUniversity of Arizonaen_US
dc.contributor.advisorStrickland, Robin N.en_US
dc.identifier.proquest1339903en_US
dc.identifier.bibrecord.b26233782en_US
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