Persistent Link:
http://hdl.handle.net/10150/277191
Title:
Efficient backtracking strategies in test generation
Author:
Yu, Tein-Yow, 1961-
Issue Date:
1989
Publisher:
The University of Arizona.
Rights:
Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
Abstract:
This thesis addresses the problem of backtracking strategies in test generation. First, a methodology which uses status of absolute dominators as a means for causing backtracking during the test generation process is presented. Then, different heuristics that force the test generation to execute the backtracking procedure are investigated. Experiments which generated test patterns for over 30,000 faults have been used to evaluate these heuristics. According to the experimental results, we recommend a new backtracking strategy that has the best performance among the six strategies explored in this thesis.
Type:
text; Thesis-Reproduction (electronic)
Keywords:
Integrated circuits -- Testing.
Degree Name:
M.S.
Degree Level:
masters
Degree Program:
Graduate College; Electrical and Computer Engineering
Degree Grantor:
University of Arizona
Advisor:
Kuo, Sy-Yen

Full metadata record

DC FieldValue Language
dc.language.isoen_USen_US
dc.titleEfficient backtracking strategies in test generationen_US
dc.creatorYu, Tein-Yow, 1961-en_US
dc.contributor.authorYu, Tein-Yow, 1961-en_US
dc.date.issued1989en_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.description.abstractThis thesis addresses the problem of backtracking strategies in test generation. First, a methodology which uses status of absolute dominators as a means for causing backtracking during the test generation process is presented. Then, different heuristics that force the test generation to execute the backtracking procedure are investigated. Experiments which generated test patterns for over 30,000 faults have been used to evaluate these heuristics. According to the experimental results, we recommend a new backtracking strategy that has the best performance among the six strategies explored in this thesis.en_US
dc.typetexten_US
dc.typeThesis-Reproduction (electronic)en_US
dc.subjectIntegrated circuits -- Testing.en_US
thesis.degree.nameM.S.en_US
thesis.degree.levelmastersen_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.disciplineElectrical and Computer Engineeringen_US
thesis.degree.grantorUniversity of Arizonaen_US
dc.contributor.advisorKuo, Sy-Yenen_US
dc.identifier.proquest1339073en_US
dc.identifier.oclc24472786en_US
dc.identifier.bibrecord.b17877416en_US
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