Atomic force microscopy of magnetic samples using optical detection methods

Persistent Link:
http://hdl.handle.net/10150/277163
Title:
Atomic force microscopy of magnetic samples using optical detection methods
Author:
Iams, Douglas Allan, 1960-
Issue Date:
1989
Publisher:
The University of Arizona.
Rights:
Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
Abstract:
An atomic force microscope is an instrument that is capable of imaging magnetic, electric and van der Waals forces with a very high resolution. In this thesis, different methods for detecting the displacement of the force sensing lever in such an atomic force microscope are discussed. Special emphasis is given to optical detection methods that are used in conjunction with a vibrating lever. The three optical systems that are discussed are based on (1) the heterodyne interferometer, (2) the homodyne interferometer, and (3) a new design that utilizes feedback into a laser diode. Images of a hard disk drive head and of domains in a TbFeCo thin film sample that were obtained with the heterodyne system are presented. Also presented are images of domains in a different TbFeCo sample and of interdigital fingers that were collected with the novel laser diode system.
Type:
text; Thesis-Reproduction (electronic)
Keywords:
Electron microscopy.; Microscopy.
Degree Name:
M.S.
Degree Level:
masters
Degree Program:
Graduate College; Optical Sciences
Degree Grantor:
University of Arizona
Advisor:
Sarid, Dror

Full metadata record

DC FieldValue Language
dc.language.isoen_USen_US
dc.titleAtomic force microscopy of magnetic samples using optical detection methodsen_US
dc.creatorIams, Douglas Allan, 1960-en_US
dc.contributor.authorIams, Douglas Allan, 1960-en_US
dc.date.issued1989en_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.description.abstractAn atomic force microscope is an instrument that is capable of imaging magnetic, electric and van der Waals forces with a very high resolution. In this thesis, different methods for detecting the displacement of the force sensing lever in such an atomic force microscope are discussed. Special emphasis is given to optical detection methods that are used in conjunction with a vibrating lever. The three optical systems that are discussed are based on (1) the heterodyne interferometer, (2) the homodyne interferometer, and (3) a new design that utilizes feedback into a laser diode. Images of a hard disk drive head and of domains in a TbFeCo thin film sample that were obtained with the heterodyne system are presented. Also presented are images of domains in a different TbFeCo sample and of interdigital fingers that were collected with the novel laser diode system.en_US
dc.typetexten_US
dc.typeThesis-Reproduction (electronic)en_US
dc.subjectElectron microscopy.en_US
dc.subjectMicroscopy.en_US
thesis.degree.nameM.S.en_US
thesis.degree.levelmastersen_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.disciplineOptical Sciencesen_US
thesis.degree.grantorUniversity of Arizonaen_US
dc.contributor.advisorSarid, Droren_US
dc.identifier.proquest1339044en_US
dc.identifier.oclc23379020en_US
dc.identifier.bibrecord.b17622414en_US
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