Applications of scanning force microscopy to magnetic and electronic media

Persistent Link:
http://hdl.handle.net/10150/277145
Title:
Applications of scanning force microscopy to magnetic and electronic media
Author:
Ingle, Jeffery Thomas, 1962-
Issue Date:
1989
Publisher:
The University of Arizona.
Rights:
Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
Abstract:
A scanning force microscope is an instrument which can image the forces present on a sample with high resolution. These forces include magnetic, electric, and atomic forces. The scanning force microscope uses either a tunneling, capacitive or optical method of sensing the motion of a lever-tip mechanical system that reacts to the forces present on a sample. There are four optical methods used in scanning force microscopy: heterodyne, homodyne, deflection and laser feedback. In this thesis, two implementations of the laser feedback method of detecting lever motion are described: a fiber coupled laser diode feedback and a tightly coupled laser diode feedback. The theory of interactions between a tip and the magnetic or electric fields at the surface of a sample are presented, along with the theory of the laser diode feedback. The limiting noises inherent in the system are discussed and representative values are given. Results of the sensitivity of the two systems are presented, and images of electric forces acting on the tip from interdigitated electrodes are demonstrated.
Type:
text; Thesis-Reproduction (electronic)
Keywords:
Scanning systems.; Stereochemistry.; Chemical microscopy.
Degree Name:
M.S.
Degree Level:
masters
Degree Program:
Graduate College; Optical Sciences
Degree Grantor:
University of Arizona
Advisor:
Sarid, Dror

Full metadata record

DC FieldValue Language
dc.language.isoen_USen_US
dc.titleApplications of scanning force microscopy to magnetic and electronic mediaen_US
dc.creatorIngle, Jeffery Thomas, 1962-en_US
dc.contributor.authorIngle, Jeffery Thomas, 1962-en_US
dc.date.issued1989en_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.description.abstractA scanning force microscope is an instrument which can image the forces present on a sample with high resolution. These forces include magnetic, electric, and atomic forces. The scanning force microscope uses either a tunneling, capacitive or optical method of sensing the motion of a lever-tip mechanical system that reacts to the forces present on a sample. There are four optical methods used in scanning force microscopy: heterodyne, homodyne, deflection and laser feedback. In this thesis, two implementations of the laser feedback method of detecting lever motion are described: a fiber coupled laser diode feedback and a tightly coupled laser diode feedback. The theory of interactions between a tip and the magnetic or electric fields at the surface of a sample are presented, along with the theory of the laser diode feedback. The limiting noises inherent in the system are discussed and representative values are given. Results of the sensitivity of the two systems are presented, and images of electric forces acting on the tip from interdigitated electrodes are demonstrated.en_US
dc.typetexten_US
dc.typeThesis-Reproduction (electronic)en_US
dc.subjectScanning systems.en_US
dc.subjectStereochemistry.en_US
dc.subjectChemical microscopy.en_US
thesis.degree.nameM.S.en_US
thesis.degree.levelmastersen_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.disciplineOptical Sciencesen_US
thesis.degree.grantorUniversity of Arizonaen_US
dc.contributor.advisorSarid, Droren_US
dc.identifier.proquest1338845en_US
dc.identifier.oclc23167727en_US
dc.identifier.bibrecord.b17584292en_US
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