Scanning tunneling microscope characterization of nickel thin film nucleation and growth

Persistent Link:
http://hdl.handle.net/10150/277130
Title:
Scanning tunneling microscope characterization of nickel thin film nucleation and growth
Author:
Kelley, Murray, 1965-
Issue Date:
1989
Publisher:
The University of Arizona.
Rights:
Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
Abstract:
A study of the nucleation, growth and final microstructure of vacuum deposited nickel films has been performed using scanning tunneling microscopy (STM) as the primary research instrument. Typical nucleation conditions are reported for nickel films grown on partially shadowed highly-oriented pyrolytic graphite (HOPG), and techniques are developed for using the STM to catalog film islands instead of more conventional electron microscopes. Values for the activation energy of surface diffusion, critical nucleus size, changes in the saturation nucleation density with temperature, and spatial variations in the nucleation rate are included. Roughening and microstructure changes observed with STM are reported as functions of substrate temperature and deposition angle for nickel films grown on highly-oriented pyrolytic graphite and fused silica. Conventional film RMS roughness values are compared to microRMS values derived from STM data and STM images of film microstructure are compared with SEM and optical microscope photographs.
Type:
text; Thesis-Reproduction (electronic)
Keywords:
Nickel films.; Surfaces.; Scanning tunneling microscopy.
Degree Name:
M.S.
Degree Level:
masters
Degree Program:
Graduate College; Optical Sciences
Degree Grantor:
University of Arizona
Advisor:
Gibson, Ursula J.

Full metadata record

DC FieldValue Language
dc.language.isoen_USen_US
dc.titleScanning tunneling microscope characterization of nickel thin film nucleation and growthen_US
dc.creatorKelley, Murray, 1965-en_US
dc.contributor.authorKelley, Murray, 1965-en_US
dc.date.issued1989en_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.description.abstractA study of the nucleation, growth and final microstructure of vacuum deposited nickel films has been performed using scanning tunneling microscopy (STM) as the primary research instrument. Typical nucleation conditions are reported for nickel films grown on partially shadowed highly-oriented pyrolytic graphite (HOPG), and techniques are developed for using the STM to catalog film islands instead of more conventional electron microscopes. Values for the activation energy of surface diffusion, critical nucleus size, changes in the saturation nucleation density with temperature, and spatial variations in the nucleation rate are included. Roughening and microstructure changes observed with STM are reported as functions of substrate temperature and deposition angle for nickel films grown on highly-oriented pyrolytic graphite and fused silica. Conventional film RMS roughness values are compared to microRMS values derived from STM data and STM images of film microstructure are compared with SEM and optical microscope photographs.en_US
dc.typetexten_US
dc.typeThesis-Reproduction (electronic)en_US
dc.subjectNickel films.en_US
dc.subjectSurfaces.en_US
dc.subjectScanning tunneling microscopy.en_US
thesis.degree.nameM.S.en_US
thesis.degree.levelmastersen_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.disciplineOptical Sciencesen_US
thesis.degree.grantorUniversity of Arizonaen_US
dc.contributor.advisorGibson, Ursula J.en_US
dc.identifier.proquest1338523en_US
dc.identifier.oclc23168184en_US
dc.identifier.bibrecord.b17584401en_US
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