Critical path tracing as a diagnostic evaluation method for sequential systems

Persistent Link:
http://hdl.handle.net/10150/276675
Title:
Critical path tracing as a diagnostic evaluation method for sequential systems
Author:
Mann, Timothy Lee, 1950-
Issue Date:
1988
Publisher:
The University of Arizona.
Rights:
Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
Abstract:
Diagnostic tests are designed to detect and isolate faults in sequential systems. The problem is to evaluate the effectiveness of the design. For stuck faults a diagnostic model can be used. A fault simulation strategy is presented for generating this model. First, definitions, for identifying critical inputs are derived. A definition is a statement of the conditions to sensitize an input. Then a fault free simulation is used to generate a critical value array. A critical path is traced through the sensitized inputs marked in the array using a critical value array tracing algorithm that is developed. This algorithm traces a path back in time, as required for a sequential system, to identify detectable faults for the model.
Type:
text; Thesis-Reproduction (electronic)
Keywords:
Critical path analysis.; Computer input-output equipment -- Testing.; Computers -- Testing.
Degree Name:
M.S.
Degree Level:
masters
Degree Program:
Graduate College; Electrical and Computer Engineering
Degree Grantor:
University of Arizona
Advisor:
Hill, F. J.

Full metadata record

DC FieldValue Language
dc.language.isoen_USen_US
dc.titleCritical path tracing as a diagnostic evaluation method for sequential systemsen_US
dc.creatorMann, Timothy Lee, 1950-en_US
dc.contributor.authorMann, Timothy Lee, 1950-en_US
dc.date.issued1988en_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.description.abstractDiagnostic tests are designed to detect and isolate faults in sequential systems. The problem is to evaluate the effectiveness of the design. For stuck faults a diagnostic model can be used. A fault simulation strategy is presented for generating this model. First, definitions, for identifying critical inputs are derived. A definition is a statement of the conditions to sensitize an input. Then a fault free simulation is used to generate a critical value array. A critical path is traced through the sensitized inputs marked in the array using a critical value array tracing algorithm that is developed. This algorithm traces a path back in time, as required for a sequential system, to identify detectable faults for the model.en_US
dc.typetexten_US
dc.typeThesis-Reproduction (electronic)en_US
dc.subjectCritical path analysis.en_US
dc.subjectComputer input-output equipment -- Testing.en_US
dc.subjectComputers -- Testing.en_US
thesis.degree.nameM.S.en_US
thesis.degree.levelmastersen_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.disciplineElectrical and Computer Engineeringen_US
thesis.degree.grantorUniversity of Arizonaen_US
dc.contributor.advisorHill, F. J.en_US
dc.identifier.proquest1333250en_US
dc.identifier.oclc20361738en_US
dc.identifier.bibrecord.b16987445en_US
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