COMPREHENSIVE TECHNIQUES TO DETERMINE BROADBAND PHYSICALLY-CONSISTENT MATERIAL CHARCTERISTICS USING TRANSMISSION LINES

Persistent Link:
http://hdl.handle.net/10150/195312
Title:
COMPREHENSIVE TECHNIQUES TO DETERMINE BROADBAND PHYSICALLY-CONSISTENT MATERIAL CHARCTERISTICS USING TRANSMISSION LINES
Author:
Zhou, Zhen
Issue Date:
2009
Publisher:
The University of Arizona.
Rights:
Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
Abstract:
Dispersion, attenuation, and crosstalk are several major challenges that both a high-speed digital and a microwave serial link must overcome to achieve their desirable performance. These phenomena are directly related to the frequency dependency of the dielectric property of the material used in package and interconnect. The dielectric property of a material is commonly measured by its manufacturer in a particular direction at a few discrete frequencies using resonator and waveguide methodology. Since the dielectric property may vary during manufacturing processing, the measurements taken by the manufacturer might be not adequate. Moreover, the dielectric property of a material in a bandwidth that covers at least the second harmonics of the fundamental operational frequency is required to accurately predict the link performance. One of the efforts in this research is to investigate the methodology of realizing broadband characteristics of the dielectric property of a material in its "as packaged" configuration using various transmission line topologies, such as microstrip line and Co-Planar Waveguide (CPW). Transitions from CPW to other transmission line topologies are mandatory if CPW probes are used to achieve broadband and repeatable measurements. Since microstrip line is one of the transmission line topologies involved in this research, a research effort is dedicated to develop a broadband CPW-to-microstrip line transition. An effort is also expended to creating casual material models that can be used in electromagnetic simulators to appropriately model the link based on the polarization mechanism of the materials. In addition to focusing on the measurement method in frequency domain, Short Pulse Propagation (SPP), a time domain method, is investigated as well. A virtual test bench is created to investigate the correlation between impedance variations in stripline structures due to fabricated tolerance and the attenuation predicted by SPP.
Type:
text; Electronic Dissertation
Keywords:
Material Characterization using transmission line
Degree Name:
Ph.D.
Degree Level:
doctoral
Degree Program:
Electrical & Computer Engineering; Graduate College
Degree Grantor:
University of Arizona
Advisor:
Melde, Kathleen L
Committee Chair:
Melde, Kathleen L

Full metadata record

DC FieldValue Language
dc.language.isoENen_US
dc.titleCOMPREHENSIVE TECHNIQUES TO DETERMINE BROADBAND PHYSICALLY-CONSISTENT MATERIAL CHARCTERISTICS USING TRANSMISSION LINESen_US
dc.creatorZhou, Zhenen_US
dc.contributor.authorZhou, Zhenen_US
dc.date.issued2009en_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.description.abstractDispersion, attenuation, and crosstalk are several major challenges that both a high-speed digital and a microwave serial link must overcome to achieve their desirable performance. These phenomena are directly related to the frequency dependency of the dielectric property of the material used in package and interconnect. The dielectric property of a material is commonly measured by its manufacturer in a particular direction at a few discrete frequencies using resonator and waveguide methodology. Since the dielectric property may vary during manufacturing processing, the measurements taken by the manufacturer might be not adequate. Moreover, the dielectric property of a material in a bandwidth that covers at least the second harmonics of the fundamental operational frequency is required to accurately predict the link performance. One of the efforts in this research is to investigate the methodology of realizing broadband characteristics of the dielectric property of a material in its "as packaged" configuration using various transmission line topologies, such as microstrip line and Co-Planar Waveguide (CPW). Transitions from CPW to other transmission line topologies are mandatory if CPW probes are used to achieve broadband and repeatable measurements. Since microstrip line is one of the transmission line topologies involved in this research, a research effort is dedicated to develop a broadband CPW-to-microstrip line transition. An effort is also expended to creating casual material models that can be used in electromagnetic simulators to appropriately model the link based on the polarization mechanism of the materials. In addition to focusing on the measurement method in frequency domain, Short Pulse Propagation (SPP), a time domain method, is investigated as well. A virtual test bench is created to investigate the correlation between impedance variations in stripline structures due to fabricated tolerance and the attenuation predicted by SPP.en_US
dc.typetexten_US
dc.typeElectronic Dissertationen_US
dc.subjectMaterial Characterization using transmission lineen_US
thesis.degree.namePh.D.en_US
thesis.degree.leveldoctoralen_US
thesis.degree.disciplineElectrical & Computer Engineeringen_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.grantorUniversity of Arizonaen_US
dc.contributor.advisorMelde, Kathleen Len_US
dc.contributor.chairMelde, Kathleen Len_US
dc.contributor.committeememberDvorak, Steven Len_US
dc.contributor.committeememberParks, Harold Gen_US
dc.identifier.proquest10722en_US
dc.identifier.oclc659753518en_US
All Items in UA Campus Repository are protected by copyright, with all rights reserved, unless otherwise indicated.