Structural and elastic properties of silver-palladium and copper-palladium superlattices.

Persistent Link:
http://hdl.handle.net/10150/186275
Title:
Structural and elastic properties of silver-palladium and copper-palladium superlattices.
Author:
Kim, Jeha.
Issue Date:
1993
Publisher:
The University of Arizona.
Rights:
Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
Abstract:
I prepared Ag/Pd and Cu/Pd superlattices using both sputtering and molecular beam epitaxy. For the Ag/Pd (t(Ag):t(Pd) = 1:1) superlattices, I observed two distinctive behaviors in the structural coherence length ξ as a function of modulation wavelength Λ. Using Brillouin light scattering (BLS) I observed a 50% enhancement of the shear elastic constant c₅₅ and a 16% increase of c₁₁ with decreasing Λ. Annealing study showed that a high structural order of the films in the growth direction was strongly correlated to the increase of c₅₅. For the 3:1 and 1:3 Ag/Pd samples, I also observed a monotonic increase of the Rayleigh velocity υ(R) (or c₅₅) with decreasing Λ and similar behavior in the structural coherence length to the 1:1 samples. In conclusion, the recrystallization of the alloy and the formation of extended interfaces by intermixing at the Ag-Pd interfaces are responsible for a large enhancement of c₅₅. Using BLS for the Cu/Pd superlattices, I observed a 24% decrease of c₅₅ as Λ was decreased to ∼30-40 Å, followed by a rapid increase for smaller Λ. The observed homogeneous strain in the growth direction showed a strong relationship with c₅₅. The strain was localized at the interface and the Cu/Pd films were in compressive stress for Λ < 38 Å. In conclusion, a localized strain at the interfaces in Cu/Pd is related to the softening in c₅₅. The measurements of in-plane lattice spacing d[220] indicated a structural transformation of the films at Λ = 14 Å from an incoherent to a coherent structure. However, the in-plane strain did not show any relationship with the softening of c₅₅. For single crystalline Cu/Pd superlattices, well-defined RHEED streaks showed incommensurate growth of Cu(111) on Pd(111) layer. The measured shear elastic constant c₅₅ showed a 26% decrease with respect to the largest Λ film with a peak at Λ ≃ 40 Å. Unlike the sputtered films, while c₅₅ decreases by 26% with decreasing Λ, the Cu/Pd films show no change in d(avg)[111] for Λ > 40 Å. I observed no in-plane anisotropies in υ(R) as predicted from theory for single crystal films.
Type:
text; Dissertation-Reproduction (electronic)
Keywords:
Dissertations, Academic.; Condensed matter.
Degree Name:
Ph.D.
Degree Level:
doctoral
Degree Program:
Physics; Graduate College
Degree Grantor:
University of Arizona
Committee Chair:
Falco, Charles M.

Full metadata record

DC FieldValue Language
dc.language.isoenen_US
dc.titleStructural and elastic properties of silver-palladium and copper-palladium superlattices.en_US
dc.creatorKim, Jeha.en_US
dc.contributor.authorKim, Jeha.en_US
dc.date.issued1993en_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.description.abstractI prepared Ag/Pd and Cu/Pd superlattices using both sputtering and molecular beam epitaxy. For the Ag/Pd (t(Ag):t(Pd) = 1:1) superlattices, I observed two distinctive behaviors in the structural coherence length ξ as a function of modulation wavelength Λ. Using Brillouin light scattering (BLS) I observed a 50% enhancement of the shear elastic constant c₅₅ and a 16% increase of c₁₁ with decreasing Λ. Annealing study showed that a high structural order of the films in the growth direction was strongly correlated to the increase of c₅₅. For the 3:1 and 1:3 Ag/Pd samples, I also observed a monotonic increase of the Rayleigh velocity υ(R) (or c₅₅) with decreasing Λ and similar behavior in the structural coherence length to the 1:1 samples. In conclusion, the recrystallization of the alloy and the formation of extended interfaces by intermixing at the Ag-Pd interfaces are responsible for a large enhancement of c₅₅. Using BLS for the Cu/Pd superlattices, I observed a 24% decrease of c₅₅ as Λ was decreased to ∼30-40 Å, followed by a rapid increase for smaller Λ. The observed homogeneous strain in the growth direction showed a strong relationship with c₅₅. The strain was localized at the interface and the Cu/Pd films were in compressive stress for Λ < 38 Å. In conclusion, a localized strain at the interfaces in Cu/Pd is related to the softening in c₅₅. The measurements of in-plane lattice spacing d[220] indicated a structural transformation of the films at Λ = 14 Å from an incoherent to a coherent structure. However, the in-plane strain did not show any relationship with the softening of c₅₅. For single crystalline Cu/Pd superlattices, well-defined RHEED streaks showed incommensurate growth of Cu(111) on Pd(111) layer. The measured shear elastic constant c₅₅ showed a 26% decrease with respect to the largest Λ film with a peak at Λ ≃ 40 Å. Unlike the sputtered films, while c₅₅ decreases by 26% with decreasing Λ, the Cu/Pd films show no change in d(avg)[111] for Λ > 40 Å. I observed no in-plane anisotropies in υ(R) as predicted from theory for single crystal films.en_US
dc.typetexten_US
dc.typeDissertation-Reproduction (electronic)en_US
dc.subjectDissertations, Academic.en_US
dc.subjectCondensed matter.en_US
thesis.degree.namePh.D.en_US
thesis.degree.leveldoctoralen_US
thesis.degree.disciplinePhysicsen_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.grantorUniversity of Arizonaen_US
dc.contributor.chairFalco, Charles M.en_US
dc.contributor.committeememberHuffman, Donald R.en_US
dc.contributor.committeememberLeavitt, John A.en_US
dc.contributor.committeememberBukie, William S.en_US
dc.identifier.proquest9328605en_US
dc.identifier.oclc717514392en_US
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