MOISTURE ADSORPTION AND OPTICAL INSTABILITY IN THIN FILM COATINGS.

Persistent Link:
http://hdl.handle.net/10150/186138
Title:
MOISTURE ADSORPTION AND OPTICAL INSTABILITY IN THIN FILM COATINGS.
Author:
LEE, CHENG-CHUNG.
Issue Date:
1983
Publisher:
The University of Arizona.
Rights:
Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
Abstract:
Materials in the form of thin films that have been deposited from the vapor phase are significantly different from similar bulk materials, both optically and mechanically, because of their columnar structure and consequent porosity. Their porosity have been verified in different ways. The effects of the pores on optical and mechanical performance and, in particular, the influence of water adsorption, have also been demonstrated. Three techniques used for investigating optical instabilities in thin films are given. They all involve sharp resonances. The resonances are associated either with surface plasmons, metal-dielectric narrowband filters, or all dielectric narrowband filters. These resonances are very sensitive functions of layer properties and hence can be used to detect and measure changes in the layers, particularly those that are induced by adsorption of moisture. Moisture adsorption in thin films is a complex process that occurs unevenly in patches. Using resonance techniques, the adsorption isotherms of change in refractive index, of growth rate in patch size, and of peak wavelength shift, which are all important in characterizing the porosity of films, have been measured. Some effects that locally increase film porosity and create central pores that permit water to penetrate into multilayer structures have been investigated. Based on these results, some suggestions for preventing water adsorption in films are then made. Moisture penetration into thin film structures is the major source of optical coating instability and it is therefore very important that the mechanisms of penetration by understood. Some deductions of the mechanisms are made from the experimental results.
Type:
text; Dissertation-Reproduction (electronic)
Keywords:
Thin films.; Thin films -- Optical properties.
Degree Name:
Ph.D.
Degree Level:
doctoral
Degree Program:
Optical Sciences; Graduate College
Degree Grantor:
University of Arizona
Advisor:
Macleod, H. Angus

Full metadata record

DC FieldValue Language
dc.language.isoenen_US
dc.titleMOISTURE ADSORPTION AND OPTICAL INSTABILITY IN THIN FILM COATINGS.en_US
dc.creatorLEE, CHENG-CHUNG.en_US
dc.contributor.authorLEE, CHENG-CHUNG.en_US
dc.date.issued1983en_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.description.abstractMaterials in the form of thin films that have been deposited from the vapor phase are significantly different from similar bulk materials, both optically and mechanically, because of their columnar structure and consequent porosity. Their porosity have been verified in different ways. The effects of the pores on optical and mechanical performance and, in particular, the influence of water adsorption, have also been demonstrated. Three techniques used for investigating optical instabilities in thin films are given. They all involve sharp resonances. The resonances are associated either with surface plasmons, metal-dielectric narrowband filters, or all dielectric narrowband filters. These resonances are very sensitive functions of layer properties and hence can be used to detect and measure changes in the layers, particularly those that are induced by adsorption of moisture. Moisture adsorption in thin films is a complex process that occurs unevenly in patches. Using resonance techniques, the adsorption isotherms of change in refractive index, of growth rate in patch size, and of peak wavelength shift, which are all important in characterizing the porosity of films, have been measured. Some effects that locally increase film porosity and create central pores that permit water to penetrate into multilayer structures have been investigated. Based on these results, some suggestions for preventing water adsorption in films are then made. Moisture penetration into thin film structures is the major source of optical coating instability and it is therefore very important that the mechanisms of penetration by understood. Some deductions of the mechanisms are made from the experimental results.en_US
dc.typetexten_US
dc.typeDissertation-Reproduction (electronic)en_US
dc.subjectThin films.en_US
dc.subjectThin films -- Optical properties.en_US
thesis.degree.namePh.D.en_US
thesis.degree.leveldoctoralen_US
thesis.degree.disciplineOptical Sciencesen_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.grantorUniversity of Arizonaen_US
dc.contributor.advisorMacleod, H. Angusen_US
dc.contributor.committeememberTurner, Frances A.en_US
dc.contributor.committeememberJacobson, Michael R.en_US
dc.contributor.committeememberGibson, Ursula J.en_US
dc.identifier.proquest8315293en_US
dc.identifier.oclc706711066en_US
All Items in UA Campus Repository are protected by copyright, with all rights reserved, unless otherwise indicated.