Rapid Capture, Analysis, and Storage of Integrated Circuit Images for Defect Analysis

Persistent Link:
http://hdl.handle.net/10150/146619
Title:
Rapid Capture, Analysis, and Storage of Integrated Circuit Images for Defect Analysis
Author:
Nation, Jonathan; Wiley, Mark; Rippstein, Travis; Hudson, Maribel; Chyan, Frederick
Issue Date:
May-2010
Publisher:
The University of Arizona.
Rights:
Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
Abstract:
An automated rapid capture, analysis and storage system for identifying chip defects is essential to ensure Intel's "Copy Exactly" methodology with low labor cost and no human subjectivity. In this system, the software will identify where the defects are with a standardized definition of defects. Constraints include the 80% defect detection rate, and Windows XP compatibility. There should be no defects that can be observed by human eye in the product shipments. Three design concepts were generated and two of them are combined to form the final design. The final design consists of a line scan cameras and two LED arrays with different wavelengths. The software design is discussed under detection and compression algorithms. Based on the software testing done, the software can identify on average 96% of the defects and compress the image up to 22 times over the current bitmap format.
Type:
text; Electronic Thesis
Degree Name:
B.S.
Degree Level:
bachelors
Degree Program:
Honors College; Optical Engineering
Degree Grantor:
University of Arizona

Full metadata record

DC FieldValue Language
dc.language.isoenen_US
dc.titleRapid Capture, Analysis, and Storage of Integrated Circuit Images for Defect Analysisen_US
dc.creatorNation, Jonathanen_US
dc.creatorWiley, Marken_US
dc.creatorRippstein, Travisen_US
dc.creatorHudson, Maribelen_US
dc.creatorChyan, Fredericken_US
dc.contributor.authorNation, Jonathanen_US
dc.contributor.authorWiley, Marken_US
dc.contributor.authorRippstein, Travisen_US
dc.contributor.authorHudson, Maribelen_US
dc.contributor.authorChyan, Fredericken_US
dc.date.issued2010-05-
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.description.abstractAn automated rapid capture, analysis and storage system for identifying chip defects is essential to ensure Intel's "Copy Exactly" methodology with low labor cost and no human subjectivity. In this system, the software will identify where the defects are with a standardized definition of defects. Constraints include the 80% defect detection rate, and Windows XP compatibility. There should be no defects that can be observed by human eye in the product shipments. Three design concepts were generated and two of them are combined to form the final design. The final design consists of a line scan cameras and two LED arrays with different wavelengths. The software design is discussed under detection and compression algorithms. Based on the software testing done, the software can identify on average 96% of the defects and compress the image up to 22 times over the current bitmap format.en_US
dc.typetexten_US
dc.typeElectronic Thesisen_US
thesis.degree.nameB.S.en_US
thesis.degree.levelbachelorsen_US
thesis.degree.disciplineHonors Collegeen_US
thesis.degree.disciplineOptical Engineeringen_US
thesis.degree.grantorUniversity of Arizonaen_US
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