Persistent Link:
http://hdl.handle.net/10150/143053
Title:
ANALYTICAL DEVELOPMENTS IN X-RAY EMISSION SPECTROMETRY.
Author:
PERRON, STEVEN JOSEPH.
Issue Date:
1982
Publisher:
The University of Arizona.
Rights:
Copyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.
Abstract:
X-Ray emission techniques have been developed for the analysis of unusual and difficult samples that cannot be analyzed by conventional analytical techniques. Three X-ray techniques have been investigated, including radioisotope-induced X-ray fluorescence (RXRF), proton-induced X-ray emission (PIXE) and high resolution PIXE. Low flux radioisotope X-ray sources have been used to non-destructively characterize the elements present in photographic papers and emulsions. The information obtained has proven valuable for cataloging and preserving photographic prints of historical significance. Radioisotope X-ray sources have also been used in the development of low-cost, portable instrumentation useful for quantitating a variety of toxicological samples, including urine and feces samples to determine the elimination rates of X-ray contrast media containing dysprosium. The PIXE technique has been applied to the analysis of forensic samples, including bullet lead, tissue fragments and thin metal coatings, and has been compared with other non-destructive methods of analysis. Sample preparation techniques and analytical procedures have been developed for general, thin target, quantitative PIXE analysis. These procedures were applied to the analysis of five NBS standard reference materials, and to the analysis of deep-sea ferromanganese nodules. A high resolution (2 eV) PIXE system has been developed to aid in the deconvolution of overlapping X-ray peaks encountered in conventional PIXE spectra. This system has been applied to the measurement of chemical shifts in the X-ray emisson spectra of transition metal compounds.
Type:
text; Dissertation-Reproduction (electronic)
Keywords:
X-ray spectroscopy
Degree Name:
Ph.D.
Degree Level:
doctoral
Degree Program:
Chemistry; Graduate College
Degree Grantor:
University of Arizona
Advisor:
Fernando, Quintus

Full metadata record

DC FieldValue Language
dc.language.isoen_USen_US
dc.titleANALYTICAL DEVELOPMENTS IN X-RAY EMISSION SPECTROMETRY.en_US
dc.creatorPERRON, STEVEN JOSEPH.en_US
dc.contributor.authorPERRON, STEVEN JOSEPH.en_US
dc.date.issued1982en_US
dc.publisherThe University of Arizona.en_US
dc.rightsCopyright © is held by the author. Digital access to this material is made possible by the University Libraries, University of Arizona. Further transmission, reproduction or presentation (such as public display or performance) of protected items is prohibited except with permission of the author.en_US
dc.description.abstractX-Ray emission techniques have been developed for the analysis of unusual and difficult samples that cannot be analyzed by conventional analytical techniques. Three X-ray techniques have been investigated, including radioisotope-induced X-ray fluorescence (RXRF), proton-induced X-ray emission (PIXE) and high resolution PIXE. Low flux radioisotope X-ray sources have been used to non-destructively characterize the elements present in photographic papers and emulsions. The information obtained has proven valuable for cataloging and preserving photographic prints of historical significance. Radioisotope X-ray sources have also been used in the development of low-cost, portable instrumentation useful for quantitating a variety of toxicological samples, including urine and feces samples to determine the elimination rates of X-ray contrast media containing dysprosium. The PIXE technique has been applied to the analysis of forensic samples, including bullet lead, tissue fragments and thin metal coatings, and has been compared with other non-destructive methods of analysis. Sample preparation techniques and analytical procedures have been developed for general, thin target, quantitative PIXE analysis. These procedures were applied to the analysis of five NBS standard reference materials, and to the analysis of deep-sea ferromanganese nodules. A high resolution (2 eV) PIXE system has been developed to aid in the deconvolution of overlapping X-ray peaks encountered in conventional PIXE spectra. This system has been applied to the measurement of chemical shifts in the X-ray emisson spectra of transition metal compounds.en_US
dc.typetexten_US
dc.typeDissertation-Reproduction (electronic)en_US
dc.subjectX-ray spectroscopyen_US
thesis.degree.namePh.D.en_US
thesis.degree.leveldoctoralen_US
thesis.degree.disciplineChemistryen_US
thesis.degree.disciplineGraduate Collegeen_US
thesis.degree.grantorUniversity of Arizonaen_US
dc.contributor.advisorFernando, Quintusen_US
dc.identifier.proquest8304725en_US
dc.identifier.proquest8304725en
dc.identifier.oclc683262099en_US
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